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Steven H. Voldman Integrated Circuit Design for Radiation Environments

Steven Voldman H. ESD


This volume is the first in a series of three books addressing Electrostatic Discharge (ESD) physics, devices, circuits and design across the full range of integrated circuit technologies. ESD Physics and Devices provides a concise treatment of the ESD phenomenon and the physics of devices operating under ESD conditions. Voldman presents an accessible introduction to the field for engineers and researchers requiring a solid grounding in this important area. The book contains advanced CMOS, Silicon On Insulator, Silicon Germanium, and Silicon Germanium Carbon. In addition it also addresses ESD in advanced CMOS with discussions on shallow trench isolation (STI), Copper and Low K materials. Provides a clear understanding of ESD device physics and the fundamentals of ESD phenomena. Analyses the behaviour of semiconductor devices under ESD conditions. Addresses the growing awareness of the problems resulting from ESD phenomena in advanced integrated circuits. Covers ESD testing, failure criteria and scaling theory for CMOS, SOI (silicon on insulator), BiCMOS and BiCMOS SiGe (Silicon Germanium) technologies for the first time. Discusses the design and development implications of ESD in semiconductor technologies. An invaluable reference for EMC non-specialist engineers and researchers working in the fields of IC and transistor design. Also, suitable for researchers and advanced students in the fields of device/circuit modelling and semiconductor reliability.

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Steven Voldman H. ESD


The scaling of semiconductor devices from sub-micron to nanometer dimensions is driving the need for understanding the design of electrostatic discharge (ESD) circuits, and the response of these integrated circuits (IC) to ESD phenomena. ESD Circuits and Devices provides a clear insight into the layout and design of circuitry for protection against electrical overstress (EOS) and ESD. With an emphasis on examples, this text: explains ESD buffering, ballasting, current distribution, design segmentation, feedback, coupling, and de-coupling ESD design methods; outlines the fundamental analytical models and experimental results for the ESD design of MOSFETs and diode semiconductor device elements, with a focus on CMOS, silicon on insulator (SOI), and Silicon Germanium (SiGe) technology; focuses on the ESD design, optimization, integration and synthesis of these elements and concepts into ESD networks, as well as applying within the off-chip driver networks, and on-chip receivers; and highlights state-of-the-art ESD input circuits, as well as ESD power clamps networks. Continuing the author’s series of books on ESD, this book will be an invaluable reference for the professional semiconductor chip and system ESD engineer. Semiconductor device and process development, quality, reliability and failure analysis engineers will also find it an essential tool. In addition, both senior undergraduate and graduate students in microelectronics and IC design will find its numerous examples useful.

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Steven Voldman H. ESD


With the growth of high-speed telecommunications and wireless technology, it is becoming increasingly important for engineers to understand radio frequency (RF) applications and their sensitivity to electrostatic discharge (ESD) phenomena. This enables the development of ESD design methods for RF technology, leading to increased protection against electrical overstress (EOS) and ESD. ESD: RF Technology and Circuits: Presents methods for co-synthesizisng ESD networks for RF applications to achieve improved performance and ESD protection of semiconductor chips; discusses RF ESD design methods of capacitance load transformation, matching network co-synthesis, capacitance shunts, inductive shunts, impedance isolation, load cancellation methods, distributed loads, emitter degeneration, buffering and ballasting; examines ESD protection and design of active and passive elements in RF complementary metal-oxide-semiconductor (CMOS), RF laterally-diffused metal oxide semiconductor (LDMOS), RF BiCMOS Silicon Germanium (SiGe), RF BiCMOS Silicon Germanium Carbon (SiGeC), and Gallim Arsenide technology; gives information on RF ESD testing methodologies, RF degradation effects, and failure mechanisms for devices, circuits and systems; highlights RF ESD mixed-signal design integration of digital, analog and RF circuitry; sets out examples of RF ESD design computer aided design methodologies; covers state-of-the-art RF ESD input circuits, as well as voltage-triggered to RC-triggered ESD power clamps networks in RF technologies, as well as off-chip protection concepts. Following the authors series of books on ESD, this book will be a thorough overview of ESD in RF technology for RF semiconductor chip and ESD engineers. Device and circuit engineers working in the RF domain, and quality, reliability and failure analysis engineers will also find it a valuable reference in the rapidly growing are of RF ESD design. In addition, it will appeal to graduate students in RF microwave technology and RF circuit design.

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Steven Voldman H. ESD: Design and Synthesis


Electrostatic discharge (ESD) continues to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a whole-chip ESD design synthesis approach. It provides a clear insight into the integration of ESD protection networks from a generalist perspective, followed by examples in specific technologies, circuits, and chips. Uniquely both the semiconductor chip integration issues and floorplanning of ESD networks are covered from a ‘top-down' design approach. Look inside for extensive coverage on: integration of cores, power bussing, and signal pins in DRAM, SRAM, CMOS image processing chips, microprocessors, analog products, RF components and how the integration influences ESD design and integration architecturing of mixed voltage, mixed signal, to RF design for ESD analysis floorplanning for peripheral and core I/O designs, and the implications on ESD and latchup guard ring integration for both a ‘bottom-up' and ‘top-down' methodology addressing I/O guard rings, ESD guard rings, I/O to I/O, and I/O to core classification of ESD power clamps and ESD signal pin circuitry, and how to make the correct choice for a given semiconductor chip examples of ESD design for the state-of-the-art technologies discussed, including CMOS, BiCMOS, silicon on insulator (SOI), bipolar technology, high voltage CMOS (HVCMOS), RF CMOS, and smart power practical methods for the understanding of ESD circuit power distribution, ground rule development, internal bus distribution, current path analysis, quality metrics ESD: Design and Synthesis is a continuation of the author's series of books on ESD protection. It is an essential reference for: ESD, circuit, and semiconductor engineers; design synthesis team leaders; layout design, characterisation, floorplanning, test and reliability engineers; technicians; and groundrule and test site developers in the manufacturing and design of semiconductor chips. It is also useful for graduate and undergraduate students in electrical engineering, semiconductor sciences, and manufacturing sciences, and on courses involving the design of ESD devices, chips and systems. This book offers a useful insight into the issues that confront modern technology as we enter the nano-electronic era.

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Steven Voldman H. ESD Testing. From Components to Systems


With the evolution of semiconductor technology and global diversification of the semiconductor business, testing of semiconductor devices to systems for electrostatic discharge (ESD) and electrical overstress (EOS) has increased in importance. ESD Testing: From Components to Systems updates the reader in the new tests, test models, and techniques in the characterization of semiconductor components for ESD, EOS, and latchup. Key features: Provides understanding and knowledge of ESD models and specifications including human body model (HBM), machine model (MM), charged device model (CDM), charged board model (CBM), cable discharge events (CDE), human metal model (HMM), IEC 61000-4-2 and IEC 61000-4-5. Discusses new testing methodologies such as transmission line pulse (TLP), to very fast transmission line pulse (VF-TLP), and future methods of long pulse TLP, to ultra-fast TLP (UF-TLP). Describes both conventional testing and new testing techniques for both chip and system level evaluation. Addresses EOS testing, electromagnetic compatibility (EMC) scanning, to current reconstruction methods. Discusses latchup characterization and testing methodologies for evaluation of semiconductor technology to product testing. ESD Testing: From Components to Systems is part of the authors’ series of books on electrostatic discharge (ESD) protection; this book will be an invaluable reference for the professional semiconductor chip and system-level ESD and EOS test engineer. Semiconductor device and process development, circuit designers, quality, reliability and failure analysis engineers will also find it an essential reference. In addition, its academic treatment will appeal to both senior and graduate students with interests in semiconductor process, device physics, semiconductor testing and experimental work.

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Steven Voldman H. ESD


Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a failure analysis and case-study approach. It provides a clear insight into the physics of failure from a generalist perspective, followed by investigation of failure mechanisms in specific technologies, circuits, and systems. The book is unique in covering both the failure mechanism and the practical solutions to fix the problem from either a technology or circuit methodology. Look inside for extensive coverage on: failure analysis tools, EOS and ESD failure sources and failure models of semiconductor technology, and how to use failure analysis to design more robust semiconductor components and systems; electro-thermal models and technologies; the state-of-the-art technologies discussed include CMOS, BiCMOS, silicon on insulator (SOI), bipolar technology, high voltage CMOS (HVCMOS), RF CMOS, smart power, gallium arsenide (GaAs), gallium nitride (GaN), magneto-resistive (MR) , giant magneto-resistors (GMR), tunneling magneto-resistor (TMR), devices; micro electro-mechanical (MEM) systems, and photo-masks and reticles; practical methods to use failure analysis for the understanding of ESD circuit operation, temperature analysis, power distribution, ground rule development, internal bus distribution, current path analysis, quality metrics, (connecting the theoretical to the practical analysis); the failure of each key element of a technology from passives, active elements to the circuit, sub-system to package, highlighted by case studies of the elements, circuits and system-on-chip (SOC) in today’s products. ESD: Failure Mechanisms and Models is a continuation of the author’s series of books on ESD protection. It is an essential reference and a useful insight into the issues that confront modern technology as we enter the Nano-electronic era.

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Steven H. Weintraub Jordan Canonical Form

Steven H. Weintraub Jordan Canonical Form

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Steven H. Voldman LLC

Dr. Steven H. Voldman is an IEEE Fellow for “Contributions in ESD protection in CMOS, Silicon On Insulator and Silicon Germanium Technology.” He was the recipient of the ESD Association Outstanding Contribution Award in 2007.

ESD (eBook, PDF) von Steven H. Voldman - Portofrei bei ...

Dr. Steven H. Voldman, IEEE Fellow, Vermont, USA Prolific Wiley writer, Dr. Steven Voldman has been involved with ESD work since 1991. He has been Chairman of the ESD Association WG 5.5 on TLP testing since 2001 and he was Chairman of the SEMATECH ESD Working Group on ESD Technology from 1995 until 1998. Dr. Voldman worked 25 years at IBM before working at Qimonda in 2007 and then TSMC ...

ESD (eBook, PDF) von Steven H. Voldman - Portofrei bei ...

ESD: Circuits and Devices 2nd Edition provides a clear picture of layout and design of digital, analog, radio frequency (RF) and power applications for protection from electrostatic discharge (ESD), electrical overstress (EOS), and latchup phenomena from a generalist perspective and design synthesis practices providing optimum solutions in advanced technologies.

Steven Voldman - Open Science Open Minds | IntechOpen

Dr. Steven H Voldman Limited Liability Company Dr. Steven H. Voldman is the first IEEE Fellow in the field of electrostatic discharge (ESD) for 'Contributions in ESD protection in CMOS, Silicon On Insulator and Silicon Germanium Technology.”

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Electrostatic discharge (ESD) continues to impact semiconductorcomponents and systems as technologies scale from micro- tonano-electronics.This book studies electrical overstress, ESD, and latchup from awhole-chip ESD design synthesis approach. It provides a clearinsight into the integration of ESD protection networks from ageneralist perspective, followed by examples in specifictechnologies ...

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Steven H. Voldman. Electrostatic discharge (ESD) continues to impact semiconductor components and systems as technologies scale from micro- to nano-electronics.This book studies electrical overstress, ESD, and latchup from a whole-chip ESD design synthesis approach. It provides a clear insight into the integration of ESD protection networks from a generalist perspective, followed by examples ...

ESD: Failure Mechanisms and Models - Steven H. Voldman ...

Steven H. Voldman Limited preview - 2009. Common terms and phrases . applications bipolar bond pad breakdown voltage capacitance cascode circuitry CMOS CMOS technology coil current paths dielectric diode string diode structure electrical breakdown Electrical Overstress/Electrostatic Discharge electrically connected electrostatic discharge ESD damage ESD events ESD failure mechanisms ESD ...

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A comprehensive and in-depth review of analog circuit layout, schematic architecture, device, power network and ESD design This book will provide a balanced overview of analog circuit design layout, analog circuit schematic development, architecture of chips, and ESD design. It will start at an introductory level and will bring the reader right up to the state-of-the-art.

Latchup By Steven H Voldman

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Dr. Steven H. Voldman, IEEE Fellow, Vermont, USA Prolific Wiley writer, Dr. Steven Voldman has been involved with ESD work since 1991. He has been Chairman of the ESD Association WG 5.5 on TLP testing since 2001 and he was Chairman of the SEMATECH ESD Working Group on ESD Technology from 1995 until 1998.

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Dr. Steven H. Voldman, IEEE Fellow, Vermont, USA. Prolific Wiley writer, Dr. Steven Voldman has been involved with ESD work since 1991. He has been Chairman of the ESD Association WG 5.5 on TLP testing since 2001 and he was Chairman of the SEMATECH ESD Working Group on ESD Technology from 1995 until 1998.

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Electrostatic discharge (ESD) continues to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a whole-chip ESD design synthesis approach. It provides a clear insight into the integration of ESD protection networks from a generalist perspective, followed by examples in specific ...

Latchup | Steven H. Voldman | download

Steven H. Voldman. Interest in latchup is being renewed with the evolution of complimentary metal-oxide semiconductor (CMOS) technology, metal-oxide-semiconductor field-effect transistor (MOSFET) scaling, and high-level system-on-chip (SOC) integration.Clear methodologies that grant protection from latchup, with insight into the physics, technology and circuit issues involved, are in ...

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ESD: Design and Synthesis by Steven H. Voldman - Books on ...

Dr. Steven H. Voldman, IEEE Fellow, Vermont, USA Prolific Wiley writer, Dr. Steven Voldman has been involved with ESD work since 1991. He has been Chairman of the ESD Association WG 5.5 on TLP...

ESD Basics: ebook jetzt bei Weltbild.de als Download

Dr. Steven H. Voldman, IEEE Fellow, Vermont, USA. Prolific Wiley writer, Dr. Steven Voldman has been involved with ESD work since 1991. He has been Chairman of the ESD Association WG 5.5 on TLP testing since 2001 and he was Chairman of the SEMATECH ESD Working Group on ESD Technology from 1995 until 1998.

ESD: Physics and Devices: Voldman, Steven H ...

[ (Electrostatic Discharge (ESD) : Physics and Devices)] [By (author) Steven H. Voldman] published on (November, 2004)

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Steven H. Voldman (Author) › Visit Amazon's Steven H. Voldman Page. Find all the books, read about the author, and more. See search results for this author. Are you an author? Learn about Author Central. Steven H. Voldman (Author) ISBN-13: 978-0470511916. ISBN-10: 9780470511916. Why is ISBN important? ISBN . This bar-code number lets you verify that you're getting exactly the right version ...

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Steven H. Voldman. ESD Basics. From Semiconductor Manufacturing to Product Use. E-Book (EPUB) 79, 99 € weitere Formate ab 96, 60 € 96, 60 € Hardcover. E-Book (EPUB) 79, 99 € inkl. gesetzl. MwSt. EPUB (mit DRM) sofort downloaden Downloads sind nur in Österreich möglich! In den Warenkorb. Click & Collect Artikel online bestellen und in der Filiale abholen. Artikel in den ...

ESD Basics - Steven H& Voldman - online bestellen | facultas.

Steven H. Voldman. ESD Basics. From Semiconductor Manufacturing to Product Use. E-Book (PDF) 79, 99 € weitere Formate ab 96, 60 € 96, 60 € Hardcover. E-Book (PDF) 79, 99 € inkl. gesetzl. MwSt. PDF (mit DRM) sofort downloaden Downloads sind nur in Österreich möglich! In den Warenkorb. Click & Collect Artikel online bestellen und in der Filiale abholen. Artikel in den Warenkorb ...

Esd - Steven H Voldman - Bok (9780470685716) | Bokus

Dr. Steven H. Voldman, IEEE Fellow, Vermont, USA Prolific Wiley writer, Dr. Steven Voldman has been involved with ESD work since 1991. He has been Chairman of the ESD Association WG 5.5 on TLP testing since 2001 and he was Chairman of the SEMATECH ESD Working Group on ESD Technology from 1995 until 1998. Dr. Voldman worked 25 years at IBM before working at Qimonda in 2007 and then TSMC ...

Steven H Voldman | Facebook

Steve Voldman has been involved in latchup technology development for 27 years. Steve Voldman worked on both technology and with product development in Bipolar SRAM, CMOS DRAM, CMOS logic, Silicon on Insulator (SOI), BiCMOS, Silicon Germanium (SiGe), RF CMOS, RF SOI, smart power, and image processing technologies.

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ESD | Wiley Online Books

ESD: Circuits and Devices 2nd Edition is an essential reference to ESD, circuit & semiconductor engineers and quality, reliability &analysis engineers. It is also useful for graduate and undergraduate students in electrical engineering, semiconductor sciences, microelectronics and IC design. Author Bios. Dr. Steven H. Voldman is the first IEEE Fellow in the field of electrostatic discharge ...

ESD by Voldman, Steven H. (ebook)

ESD: Design and Synthesis by Steven H. Voldman. Electrostatic discharge (ESD) continues to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a whole-chip ESD design synthesis approach. It provides a clear insight into the integration of ESD protection networks from a generalist ...

9780470847534: ESD: Physics and Devices - AbeBooks ...

Voldman, Steven H. 0 avg rating • (0 ratings by Goodreads) Hardcover ISBN 10: 0470847530 ISBN 13: 9780470847534. Publisher: Wiley, 2004. This specific ISBN edition is currently not available. View all copies of this ISBN edition: Synopsis; About this title; This volume is the first in a series of three books addressing Electrostatic Discharge (ESD) physics, devices, circuits and design ...

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Esd Basics: From Semiconductor Manufacturing to Product ...

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Esd : Steven H. Voldman : 9780470685716

Esd by Steven H. Voldman, 9780470685716, available at Book Depository with free delivery worldwide.

Steven H. Voldman LLC

Steven H. Voldman LLC. Consulting, Expert Witness, Training, Teaching, and Tutorials. Services. Consulting services, to education support are offered for corporations, technical conferences, and universities. Educational training and support includes technical short courses, in-house courses, open community lectures, technical presentations, to university short courses. Educational courses are ...

Esd Analog Circuits And Design By Steven H Voldman

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ESD - E-bok - Voldman Steven H Voldman (9781118954478) | Bokus

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ESD | Wiley Online Books

Voldman’s new book will serve as an essential and practical guide to the greater IC community. With high practical and academic values this book is a “bible” for professionals, graduate students, device and circuit designers for investigating the physics of ESD and for product designs and testing.

Latchup (eBook pdf), Steven H. Voldman

Steven H. Voldman is an IEEE Fellow for 'Contributions inESD Protection in CMOS, Silicon on Insulator and Silicon GermaniumTechnology'. He has a B.S. engineering science from University ofBuffalo (1979), a first M.S. EE (1981) from Massachusetts Instituteof Technology (MIT), a second EE degree (engineering degree) fromMIT,a M.S. in engineering physics (1986) and a Ph.D. EE (1991 ...

ESD Testing : Steven H. Voldman : 9780470511916

Dr Steven H. Voldman, IEEE Fellow, Vermont, USA Dr. Steven H. Voldman is the first IEEE Fellow in the field of electrostatic discharge (ESD) for Contributions in ESD protection in CMOS, Silicon On Insulator and Silicon Germanium Technology. Voldman was a member of the semiconductor development of IBM for 25 years as well as a consultant for TSMC, and Samsung Electronics. Dr. Voldman initiated ...

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Esd Analog Circuits And Design By Steven H Voldman

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Michel Mardiguian Electro Static Discharge


A thorough and concise treatment of ESD Recognizing its methodic, step-by-step attack of the electrostatic discharge (ESD) problem, the initial release of this book was quoted by specialists as «the most thorough and concise treatment of the broad ESD continuum that is available.» Now in its Third Edition, this book delivers the same trusted coverage of the topic while also incorporating recent technological advances that have taken place in the engineering community. The book begins with the basics of ESD for humans and objects, and goes on to cover: Effects of ESD coupled to electronics Principal ESD specifications ESD diagnostics and testing Design for ESD immunity To help with troubleshooting, many ESD case histories are given along with their successful fixes. Electrostatic Discharge is essential reading for all designers who want to avoid component failures, no trouble found incidents, and random errors.

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Steven Ogg


Steven Ogg

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R. Nagarajan Contamination and ESD Control in High Technology Manufacturing


A practical «how to» guide that effectively deals with the control of both contamination and ESD This book offers effective strategies and techniques for contamination and electrostatic discharge (ESD) control that can be implemented in a wide range of high-technology industries, including semiconductor, disk drive, aerospace, pharmaceutical, medical device, automobile, and food production manufacturing. The authors set forth a new and innovative methodology that can manage both contamination and ESD, often considered to be mutually exclusive challenges requiring distinct strategies. Beginning with two general chapters on the fundamentals of contamination and ESD control, the book presents a logical progression of topics that collectively build the necessary skills and knowledge: Analysis methods for solving contamination and ESD problems Building the contamination and ESD control environment, including design and construction of cleanrooms and ESD protected environments Cleaning processes and the equipment needed to support these processes Tooling design and certification Continuous monitoring Consumable supplies and packaging materials Controlling contamination and ESD originating from people Management of cleanrooms and ESD protected workplace environments Contamination and ESD Control in High-Technology Manufacturing conveys a practical, working knowledge of contamination and ESD control strategies and techniques, and it is filled with case studies that illustrate key principles and the benefits of contamination and ESD control. Moreover, its straightforward style makes the material, which integrates many disciplines of engineering and science, clear and accessible. Written by three leading industry experts, this book is an essential guide for engineers and designers across the many industries where contamination and ESD control is a concern.

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TX3 mini TV Box Quad Core High Performance GPU ESD Circuit Design


TX3 mini TV Box Quad Core High Performance GPU ESD Circuit Design

2578.48 RUR
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Aerosmith / Steven Tyler


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